More Sample Preparation for SEM and X-ray Microanalysis

X-ray microanalysis attachment for electron microscope.

Fundamental Constants for Quantitative X-ray Microanalysis.

Quantitative X-ray microanalysis requires the use of many fundamental constants related to the interaction of the electron beam with the sample. The current state of our knowledge of such constants in the particular areas of electron stopping power, X-ray ionization cross-sections, X-ray fluorescence yield, and the electron backscattering yield, is examined. It is found that, in every case, the...

Sample Preparation for Electron Probe Microanalysis—Pushing the Limits

There are two fundamental considerations in preparing samples for electron probe microanalysis (EPMA). The first one may seem obvious, but we often find it is overlooked. That is, the sample analyzed should be representative of the population from which it comes. The second is a direct result of the assumptions in the calculations used to convert x-ray intensity ratios, between the sample and s...

X-ray Diffraction and SEM Studies on the Effect of Temperature on the Formation of Main Phase Sr2MgSi2O7 Using a Wet and Dry Method for its Preparation

A pure Silicate host namely Sr2MgSi2O7 as a support for a long-lasting afterglow when dopped with rare-earth elements was sought after. To this end the process of obtaining firing temperatures of the above mentioned phase in normal condition was carried out using suggested wet and dry methods. The degree of purity obtained in these preparatory methods as wel...

X-Ray microanalysis of stratified specimens

This paper presents a description of the state of the art methodology and software for the application of x-ray microanalysis to thin surface layers and more generally to the characterization of stratified specimens. The sensitivity of the technique to near-surface segregation is demonstrated. Some emphasis is given on the eS(pz) function (the distribution in depth of the primary generated x-ra...